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Alec Stanculescu, Fintronic USA Alex Zamfirescu, ASC MAPLD 2004 September 8-10, 2004

Alec Stanculescu, Fintronic USA Alex Zamfirescu, ASC MAPLD 2004 September 8-10, 2004 alec@fintronic.com alexz@ascinc.com. Design Verification Method for Radiation Hardness using Simulation Farms. Fintronic USA. Summary. Problem Addressed Solution Proposed Conclusion

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Alec Stanculescu, Fintronic USA Alex Zamfirescu, ASC MAPLD 2004 September 8-10, 2004

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  1. Alec Stanculescu, Fintronic USA Alex Zamfirescu, ASC MAPLD 2004 September 8-10, 2004 alec@fintronic.com alexz@ascinc.com Design Verification Method for Radiation Hardness using Simulation Farms

  2. Fintronic USA Summary • Problem Addressed • Solution Proposed • Conclusion • Proposed Plan

  3. Introduction • Circuits malfunction due to radiations • Transient errors may lead to Soft errors if an erroneous data is latched • Cumulative effects may lead to permanent ( hard) errors (total dose)

  4. Problem Addressed • Reduce the cost of assessing the behavior of very large circuits under different radiation conditions by providing fast feedback to circuit designers regarding: • statistics of faults • reliability • nature of degradation

  5. Solution Proposed • Simulate radiation effect by injecting faults in the simulation based on the radiation failure susceptibility of the library cells used • Use efficiently a simulation farm • Automate the analysis of results

  6. Radiation Hardness Analyzer

  7. Radiation Failure Susceptibility • For each cell, for each wire, record • <time window> <fault_info_triplet>+ • <fault_info_triplet> ::= <p of a given fault-type occurring in the given window>, <type of fault>, <p of at most one fault of the given type occurring in the given window>; where p stands for probability

  8. Creation of Radiation Failure Susceptibility Data • Calibration of Simulation • High correlation between simulation results and manufactured circuit • Calibration Methods • Test all cells at various radiation environments

  9. Calibration Methods • Fabricate all supported cells on tested chip – selection of tests may affect calibration • Use existing circuits for testing • Use an un-hardened version of the actual circuit • Use transistor susceptibility based on specific measurements

  10. FinFarm:Verilog Simulation Farm • Enables one engineer to manage many simultaneous simulations • Network of computers • Farming methodology • Farming tools • Current farms use between 10 and more than 1000 licenses

  11. Farming Methodology • Un-partitioned circuits • small footprint & 64-bit simulation helps • Split stimulus • Simultaneous verification of alternative components • Program feedback-based verification

  12. Farming Tools • Perform automated • simulation launching • simulation queuing • collection & reporting of simulation results • collection & merging of code coverage results • Perform real-time monitoring • Perform programmed re-launching of simulations

  13. FinFarm™ Usage • Regression Testing • Extensive Exploration of Design Space • Evaluation of Reusable IPs • Analysis of Design Trade-Offs: Power, Size, Speed and search for optimal solution using feedback loop • Radiation Hardening

  14. Rad. Hard. Simulation • Describing effects on circuit by a given radiation environment, using VCD-F format (VCD fault format) • VCD-F Reader injects corresponding faults in simulation • Launching simultaneous simulations using simulation farm • Collecting and processing results

  15. VCD-F Format • VCD IEEE std 1364 results • VCD-F specifies random faults, i.e. values are replaced by: • Fault types • Randomization info

  16. VCD-F Reader • VCD-F Reader injects faults in simulation. • Nature of faults: permanent, transient • Kind of faults: stuck at, bridging, cross talk, gate rupture, value toggle, timing, etc.

  17. Simulation Launching • Save simulations at various check points, just before inserting faults • Re-start simulation at latest checkpoint before the injected fault which caused errors • Launch simultaneous simulations on FinFarm™

  18. Collecting and Processing Results • Record results databases • Compare Results Databases • Isolate circuits containing at least one error, for detailed analysis • List of possible fault type • Produce reports

  19. Summary of Solution • Cells are measured once and results are stored in IEEE standard • Use Monte Carlo technique to establish radiation susceptibility of complex ICs using simulation • Fast feedback to designers • Major cost reduction

  20. Proposed Plan • Establish a radiation assessment lab • Create oversight task force • Government • Industry • Academia • Createstandards for describing • Radiation failure susceptibility of cells • Distribution of faults in circuits in time

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