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Vacuum Test 8 th August – 2 nd September

Vacuum Test 8 th August – 2 nd September. Strip. Strip. Strip. Strip. PHI 2391- 19A. PHI 2391- 21 D. PHI 23 13 - 1 7C. PHI 23 13 - 20. Guard. Guard. Guard. Guard. Test setup. Vacuum system. Switch. I. T. Temp. V. 350V. Backplane bias. IV characteristics of PHI 2313-17C.

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Vacuum Test 8 th August – 2 nd September

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  1. Vacuum Test 8th August – 2nd September LHCb Sensor – W.Kucewicz

  2. Strip Strip Strip Strip PHI 2391- 19A PHI 2391- 21 D PHI 2313- 17C PHI 2313- 20 Guard Guard Guard Guard Test setup Vacuum system Switch I T Temp V 350V Backplane bias LHCb Sensor – W.Kucewicz

  3. IV characteristics of PHI 2313-17C LHCb Sensor – W.Kucewicz

  4. IV characteristics of PHI 2391-21D LHCb Sensor – W.Kucewicz

  5. IV characteristics of PHI 2313-20 LHCb Sensor – W.Kucewicz

  6. IV characteristics of PHI 2391-19A LHCb Sensor – W.Kucewicz

  7. 9 August – 2 September 2005 Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  8. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  9. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  10. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  11. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  12. Vacuum Tests (4.6x10-8 Torr, 350 V) LHCb Sensor – W.Kucewicz

  13. Conclusion • Vacuum test was done from 9 August till 2 September. • It was tested 4 sensors sitting in vacuum chamber at 4*10^-8 Tr, measuring strip and guardring currents of each at 350V. • No significant fluctuation of current was observed after slight current increasing in the first days of the test. • Seems that the temperature fluctuation has more significant influence to the characteristics than vacuum ambient (look at point around the 24 day) LHCb Sensor – W.Kucewicz

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