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Status Update of IEEE CS Test Technology Technical Council

Status Update of IEEE CS Test Technology Technical Council. Yervant Zorian TTTC Senior Leadership Board. Objectives. Source of state of the art test technology Emerging test standards Novel information sharing forums Network of design & test professionals

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Status Update of IEEE CS Test Technology Technical Council

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  1. Status Update of IEEE CS Test Technology Technical Council Yervant Zorian TTTC Senior Leadership Board

  2. Objectives • Source of state of the art test technology • Emerging test standards • Novel information sharing forums • Network of design & test professionals • Address next test technology challenges • All activities concentrate in a single community and a single organization

  3. TTTC Chair 1st Vice-Chair TechnicalMeetingsGroup TechnicalActivitiesGroup Asia &PacificGroup Tutorials &Education Group Standards Group Communi-cationGroup StandingCommitteeGroup 2ndVice-Chair EuropeGroup Programs IEEE 1149.1 Booth Awards TechnicalMeetingReview Committee TAC # 1 Past Chair IEEE P1149.4 Database & Member. Bylaws Newinitiatives TAC # 2 SeniorLeadership Latin AmericaGroup TM # 1 IEEE P1149.5 Electronic Broadcast History Organiza-tion ITC Gen Chair TM # 2 IEEE 1450 Marketing Nomina-tion D&TEIC NorthAmericaGroup IEEE 1500 Planner Students Secretary TAC # 13 News-letters Finance TAC # 14 TM # n Social Media

  4. Technical Meeting Group • Portfolio of different Technical Meetings developed over many years by dedicated volunteers worldwide • Addresses range of industrial challenges • Generally – successful and viable • Technically, Financially , Culturally and geographically • Different types of technical meetings • Regional/Geographical (wide topics) – ATS, ETS, LATW • Topical (focused technical topic or small group of topics) - Board Test Workshop • Wide-scoped (technical and geographical) --- ITC, VTS • Maturity • Range of maturities • Range from several decades to born this year!

  5. ETS DDECS EWDTS LATW IDT TTTC Technical Meetings DELTA ATS

  6. IOLT Field DfM&Y Factory Design HLDVT System SiP Board Core Die MTDT SoC 1149.1 STD Analog Memory btw MTV 1149 Processor 3DIC Topical Proliferation Product Life Cycle Levels of Integration Technology

  7. Two Achievement Awards • TTTC Most Successful Technical Meeting Award • TTTC Most Populous Technical Meeting Award • Seventh time to be presented at VTS 2012

  8. TTTC Sponsored Most Successful Technical Meeting • 3D-Test (Anaheim, Nov. 2011) • 2nd IEEE Int’l Workshop on Testing Three-Dimensional Stacked Integrated Circuits) • Chairs: • Yervant Zorian, Synopsys; • Erik Jan Marinissen, IMEC; • Said Hamdioui, Delft University

  9. TTTC Sponsored Most Populous Technical Meeting • 20th ATS (Asian Test Symposium 2011, New Delhi, India) Chairs: A. Chatterjee, Georgia Tech A. Patra, IIT Kharagpur S. Kundu, U Mass S. Ravi, Texas Instruments

  10. TTTC Best Doctoral Dissertation • Most impactful PhD thesis • Selected by panel of industrial judges • Award held at VTS for 5 years • Expand international participation • Two step selection process • Multi-site selection for semi-finalists • Single-site selection for finalist

  11. TTTC Best Doctoral Dissertation • Award in honor of: Prof. Edward J. McCluskey • Long time test educator • Director CRC Stanford Univ. • 1st President of IEEE CS • 2002 Recipient of TTTC Lifetime Contribution Award

  12. Gerald W. Gordon Award • Award in honor of longtime ITC volunteer, Gerald Gordon • Award presented to student • with interest in test • who has done volunteer work for the test community • Sponsored by ITC, TTTC, IEEE Philadelphia Section

  13. TTTC Lifetime Contribution Medal • Outstanding Technical Contribution • Fundamental Impact on Test Technology • Granted Annually • Presented at a Major TTTC Event • Featured in IEEE Design & Test • Call for Nominations (June 30, 2012)

  14. A. d’Arbeloff E. Eichelberger E.J. McCluskey P. H. Bardell R. Tulloss Past Recipients J. Mucha T.W. Williams J. H. Arabian M. Mahoney

  15. Looking Forward • Source of state of the art test technology • 3D designs, nanoscale technology, …. • Emerging test standards • Modern network of test professionals • Novel information sharing forums • Contribute to its multitude of forums

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