Efficient Embedding of Deterministic Test Data
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Efficient Embedding of Deterministic Test Data. Mudassar Majeed 1 , Daniel Ahlström 1 , Urban Ingelsson 1 , Gunnar Carlsson 2 and Erik Larsson 1. 1 Department of Computer and Information Science, Linköping University, Sweden. 2 Ericsson AB BU Networks SE-164 80 Stockholm Sweden. Purpose.

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Efficient Embedding of Deterministic Test Data

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Efficient embedding of deterministic test data

Efficient Embedding of Deterministic Test Data

Mudassar Majeed1, Daniel Ahlström1, Urban Ingelsson1,

Gunnar Carlsson2 and Erik Larsson1

1Department of Computer and Information Science, Linköping University, Sweden

2Ericsson AB BU Networks SE-164 80 Stockholm Sweden


Purpose

Purpose

  • Printed Circuit Boards (PCBs) include an increasing number of integrated circuits (ICs), often of the same type

  • Example:

    • Ericsson telecommunication systems contain PCBs with 36 ICs where 4 ICs are of type A, 8 ICs of type B, 8 ICs of type C and 16 ICs of type D

  • In-field testing is needed due to harsh environment

  • For in-field test, the problem is to deliver test data to the system

  • Straight forward solution is to store test data in the system

    • Drawbacks:

      • High memory requirements

      • Inflexibility in applying different tests

  • The proposed solution uses an embedded test controller to manipulate test data by exploiting structural information of the system

    • Benefits: Reduces memory requirements and provides flexibility

Efficient Embedding of Deterministic Test Data


Outline

Outline

  • Introduction

  • Proposed Solution

  • Experiments and Results

  • Conclusions

MARKERINGSYTA FÖR BILDER

När du gör egna slides, placera bilder och andra illustrationer inom dessa fält. Titta gärna i ”baspresentationen” för exempel på hur placeringen kan göras.


Need for remote system test

Need for Remote System Test

  • Flexibility in applying commands

  • Embedded test solution

Command 1:

Test All Components

Command 2:

Test Only Component A

Test Engineer at Office

System at Remote Location

Introduction


Embedded test solution

Embedded Test Solution

Command 1:

Test All Components

Test

Data

Components

Embedded

Test

Solution

A

B

B

Test

Resp.

Command 2:

Test Only Component A

PCB

Introduction


Ieee 1149 1 standard

A

IEEE 1149.1 Standard

ICs connected serially (IEEE 1149.1)

B

B

  • IEEE 1149.1 Standard for PCB testing

  • Supports testing core logic

  • Instructions INTEST, BYPASS

Introduction


Ic under test using ieee 1149 1 standard

A

IC Under Test Using IEEE 1149.1 Standard

Test component A

Bypass component A

A

1 bit

4 bits

BYPASS

INTEST

Stimuli:

Instruction:

INTEST A

BYPASS A

IEEE 1149.1

  • IR-scan: Set instruction

  • DR-scan: Apply (execute)

    IR-scan defines the length of the 1149.1 chain

Introduction


System under test using ieee 1149 1 std

A

A

System Under Test Using IEEE 1149.1 Std.

B

B

Command 1:

Test All Components

INTEST A

INTEST B

INTEST B

Test Vectors

B

B

Command 2:

Test Only Component A

INTEST A

BYPASS B

BYPASS B

Introduction


Naive embedded test controller

Naive Embedded Test Controller

Command 1:

Test All Components

(INTEST A

INTEST B

INTEST B)

CPU

Command 2:

Test Only Component A

(INTEST A

BYPASS B

BYPASS B)

Memory

Embedded Test Solution

High memory requirements and inflexibility in applying the tests

Introduction


Outline1

Outline

  • Introduction

  • Proposed Solution

  • Experiments and Results

  • Conclusions

MARKERINGSYTA FÖR BILDER

När du gör egna slides, placera bilder och andra illustrationer inom dessa fält. Titta gärna i ”baspresentationen” för exempel på hur placeringen kan göras.


Key idea

Key Idea

Command 1: Test All Components

INTEST A INTEST B INTEST B

Command 2:Test Only Component A

INTEST A BYPASS B BYPASS B

1

2

Structural

Information

Command 1:

Type A

3

Concatenator

Type B

Command 2:

Command

Memory

Embedded Test Solution

Provides flexibility in applying the tests

Proposed Solution


1 memory requirements

1. Memory Requirements

Comparison

Memory

Memory

Naive approach

Proposed concatenation approach

Reduces memory requirements

Proposed Solution


2 structural information

A

2. Structural Information

B

B

Structural Information

-Types of components

-Order of components in the system

-Instruction Register Length

-Data Register Length

-Instructions

Proposed Solution


3 concatenator

A

3. Concatenator

B

B

Steps for a given command:

Read structural information

Read component specific test stimuli

Concatenate the stimuli

Scan in instruction vector (if required)

Scan in and apply test vector

Scan out test response

Compare with expected response

If exit condition met, then terminate

Else repeat step 2

Proposed Solution


Outline2

Outline

  • Introduction

  • Proposed Solution

  • Experiments and Results

  • Conclusions

MARKERINGSYTA FÖR BILDER

När du gör egna slides, placera bilder och andra illustrationer inom dessa fält. Titta gärna i ”baspresentationen” för exempel på hur placeringen kan göras.


Objectives

Objectives

  • To show that the approach works:

    • We used a PC as test controller and an FPGA as system under test

  • To see how memory requirements are reduced:

    • Naive Approach vs Proposed Concatenation Approach (for test command: “test all components”)

    • We created systems using industrial circuits as ICs

% Reduction in

Memory Requirements

=

Experiments and Results


Industrial circuits

Industrial Circuits

Z. Wang and K. Chakrabarty. Test data compression for IP embedded cores using selective encoding of scan slices. In Proc. International Test Conference (ITC), pp. 581--590, 2005.

Experiments and Results


Industrial circuits1

Industrial Circuits

ckt-1

ckt-2

ckt-3

ckt-4

ckt-5

ckt-6

ckt-7

ckt-8

Set

# of Multiplications

Design

2

1

3

20

2

3

2

20

2

3

8

20

Experiments and Results


Results

Results

Set 8 (ckt-8, 237.6 MBs)

MBs

Set 1 (ckt-1)

Set 2 (ckt-2)

Set 3 (ckt-3)

Set 7 (ckt-7)

Set 4 (ckt-4)

Percentage Reduction in Memory Requirements

Set 5 (ckt-5)

Average

Set 6 (ckt-6)

Set 7 (ckt-7)

Set 8 (ckt-8)

Average

Set 1 (ckt-1)

Number of Multiplications

Experiments and Results


Conclusions

Conclusions

  • Printed Circuit Boards (PCBs) include an increasing number of integrated circuits (ICs), often of the same type

  • Systems fail in operation and require in-field testing

  • Test data volume requires huge memory

  • The proposed solution exploits,

    • Structural Information of the system

    • The fact that multiple components of the same type require same test data

    • The test data manipulation via an embedded test controller

  • The reduction in memory requirements depends upon the number of components of the same type

    • Example:

      • Ericsson telecommunication systems contain PCBs with 36 ICs where 4 ICs are of type A, 8 ICs of type B, 8 ICs of type C and 16 ICs of type D


Efficient embedding of deterministic test data

Efficient Embedding of Deterministic Test Data

Mudassar Majeed1, Daniel Ahlström1, Urban Ingelsson1,

Gunnar Carlsson2 and Erik Larsson1

1Department of Computer and Information Science, Linköping University, Sweden

2Ericsson AB BU Networks SE-164 80 Stockholm Sweden


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