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Font@ESA (T-488)

Font@ESA (T-488). FONT: C Clarke, C Swinson, P Burrows, T Hartin, G Christian, H Dabiri Khah SLAC: Mike Woods, Ray Arnold, Steve Smith et al. FONT ESA Test Module -design. Material model of ILC outgoing beamline. QFEX1. BPM. beamcal. low Z mask. FONT ESA Test Module –in situ.

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Font@ESA (T-488)

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  1. Font@ESA (T-488) FONT:C Clarke, C Swinson, P Burrows, T Hartin, G Christian, H Dabiri Khah SLAC:Mike Woods, Ray Arnold, Steve Smith et al

  2. T Hartin Eurotev 8-Jan-07 FONT ESA Test Module -design Material model of ILC outgoing beamline QFEX1 BPM beamcal low Z mask

  3. T Hartin Eurotev 8-Jan-07 FONT ESA Test Module –in situ

  4. T Hartin Eurotev 8-Jan-07 Beam test outline AIM:Recreate ILC-like background hits on BPM • Pass 30 GeV main beam through Be radiator, select momentum bites and transport to A-line • bunch charge 106 1010 obtained by varying transmission at slits • x,y shift beam to impinge on lowZ mask and produce spray ILC/ESA Comparison ESA: initial 106 charge bunch produces ~2x106 e+e- per strip ILC: scheme 14, ~ 2x104 e+e- per strip

  5. T Hartin Eurotev 8-Jan-07 Raw voltage from BPM pickoffs • main component is the usual bipolar doublet – 1ns between peaks reflects the 30cm round trip up and down the strip • secondary “noise” feature apparent in BPM D – “noise” to “signal” ratio should be the greatest here for this configuration

  6. T Hartin Eurotev 8-Jan-07 Geant Data Net Q at upstream end of BPM strips Q = -16529 Incident Q = -10000 • 1mm spot size incident on low Z at (x,y)=(1.4,0) • “Signal” obtained by counting net charge passing by strips • “Noise” obtained by counting net charge in the secondary emission from the striplines • Time response obtained from GEANT T.O.F. parameter BPM1 s.e. Q = -2297 Incident beam spot BPM2 s.e. Q = -2057 BPM4 s.e. Q = -1908 BPM3 s.e. Q = -2848

  7. T Hartin Eurotev 8-Jan-07 How to model the noise? Voltage pickoff Possible “noise” components: • Incident hits – partly make up the “signal” as main charge bunch passes voltage pickoff – these are generally tangential – must take into account the change in image charge. Charges moving toward a strip roughly balanced by those moving away from it, so no net effect from incident hits • Emitted hits – electrons yield positive (+ reflected negative) voltage pulse, positrons the opposite. Reflected voltage pulse “piles up” BPM wall Charges emitted from strips BPM strip “noise” voltage pulse Charges incident on strips

  8. T Hartin Eurotev 8-Jan-07 TOF histogram “raw” charges • This is “raw” because… • we have to balance signal against noise by taking into account the fraction of the image charge on each strip • we want to compare with real voltage measurements, take into account residual impedance and capacitance in the measuring circuit Reflected “signal” after round trip of 30cm/c = 1.0 ns “signal” is almost a delta function at upstream end of BPM strips “Noise” Reflected“Noise”

  9. T Hartin Eurotev 8-Jan-07 Simulate measured voltages Broaden analytic signal pulse by passing through a 2nd order 1.2 GHz Butterworth Low pass filter

  10. T Hartin Eurotev 8-Jan-07 Simulated Signal+Noise results

  11. T Hartin Eurotev 8-Jan-07 New ESA run 2007 • 2006 run aimed the primary beam at LowZ mask directly – noise to signal higher than we can expect at ILC • Modify the module to include thin radiator • Match spray to expected ILC spray

  12. T Hartin Eurotev 8-Jan-07 Geant studies to compare ILC and ESA • Energy spectra at LowZ mask different between ILC/ESA, but… • At BPM strips the spectra is similar • 5% Al radiator ~ 1m upstream of lowZ mask delivers noise:signal ratio twice that of ILC-can adjust down

  13. T Hartin Eurotev 8-Jan-07 Further work • Further data run at ESA in 2007 • Insert thin radiator upstream of LowZ mask • Attach FONT processer to gauge effect of noise on processed signal • Firm up simulations by • Theoretical considerations of noise • Full electromagnetic simulation

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