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EBB 511 – Materials Characterization

EBB 511 – Materials Characterization. Azizan Aziz Ph.D Projjal Basu Ph.D. Synopsis. 1. Introduction. 2. Characterization Techniques 2.1 X-ray Diffraction (XRD) 2.2 Scanning Electron Microscope (SEM) 2.3 Transmision Electron Microscope(TEM) 2.4 Scanning Probe Microscopy

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EBB 511 – Materials Characterization

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  1. EBB 511 – Materials Characterization Azizan Aziz Ph.D Projjal Basu Ph.D

  2. Synopsis 1. Introduction 2. Characterization Techniques 2.1 X-ray Diffraction (XRD) 2.2 Scanning Electron Microscope (SEM) 2.3 Transmision Electron Microscope(TEM) 2.4 Scanning Probe Microscopy 2.4.1 Scanning Tunneling Microscope 2.4.2 Atomic Force Microscope 2.5 Fourier Transform Infra-Red (FTIR) 2.6 UV-Vis (UV) 2.7 Thermal Analysis 3. The theoretical background,instrumentation and applications of these techniques will be discuss.

  3. Reference Books 1. An Introduction to Analytical Atomic Spectrometry; L.Ebdon, E.H. Evans, A. Fisher,S.J. Hill; Wiley; 1998 2. A Guide to Materials Characterization and Chemical Analysis; Edited by John P. Sibilia 3. Materials Science and Technology: Characterization of Materials; Volume 2A Part I dan 2B Part II 4. X-ray Diffraction : A Practical Approach; C. Suryanarayana & M. Grant Norton; Plenum Press;1998 5. X-ray Diffraction Procedures for polycrystalline and amorphous Materials; Harold P. Klug and Leroy E. Alexander ,1974 6. An Introduction To Thermal Analysis: Techniques and applications; Michael E. Brown, Chapman and Hall;1988 7. X-ray Characterisation of Materials; Ed. Eric Lifshin; Wiley-VCH ;1999 8. Scanning Probe Microscopy and Spectroscopy:Theory,Techniques and Applications; 2 edition;Ed. Dawn Bonnell; Wiley-VCH, 2000

  4. 9. Brian C. Smith, “ Fundamentals of Fourier Transform Infrared Spectroscopy” CRC Press, New York (1996) Dana W. Mayo, et al , “ Course Notes on the Interpretation of Infrared And Raman Spectra” Wiley Interscience (2004)

  5. Assessment Course Work (40%) Test (15%) Assignment (25%)** Exam (60%) **Titles of assigments will be made known later

  6. Materials Characterization • Materials Characterization has 2 main aspects - Accurately measuring the physical and chemical properties of materials - Accurately measuring (determining) the structure of a material - atomic level structure - Microscopic level structures

  7. A critical part of Materials Science and Engineering is to study the relationships between • Properties of materials • Structures and Microstructures • The processing used to make the materials • The ultimate Performance of that materials in use

  8. Characterisation of Solid Samples Structural Properties Surface phenomena Bulk elemntal composition IR spectrom. Dynamic SIMS. Dissolution step Direct solid analysis UV-Vis spectrom Static SIMS Atomic absorption Electron. microscope XRD/FESEM SEM/FESEM TEM./HRTEM ICP spectrometry SEM-EDX XPS/SAM ICP mass spect. CHN analyser dilatometry. AFM

  9. Excitation Source Detector Sample

  10. Titles of Assignment • Scanning Probe Microscopy : Its Impact on Materials Science Research • Atomic Force Microscopy and Its application in nanomaterials characterisation • Characterisation of Nanoscale characterisation • X-ray Diffraction as a tool in Materials Characterisation • SEM and SPM: Comparison, the variant,limitation,advantages and its applications • Application of FTIR in Materials Science • AFM in surface engineering • STM and AFM in Nanotechnology • Application of XRD in the characterisation of Nanomaterials • Application of UV-Vis in Materials characterisation Only two (2) students per title. First come first serve basis. Submit the assigmnent by 10th Week - 12 September 2008 Marks will be given base on originality of the work. Cut and paste from source will not carry high grade. Format should be journal standard.

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