Superconducting Single Photon Nanowire Detectors Development for IR and THz applications. L08. I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman
Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author.While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server.
Development for IR and THz applications
I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman
Moscow State Pedagogical University, Moscow 119992, Russia
State-of-the-art NbN SSPDs
Single Photon Superconducting Detectors (SSPDs)
The mature technology is developed for NbN SSPDs.
’Standard’ Device Design
Advanced SSPD Design
SEM image of the 10 mm x 10 mm SSPD
Spectral dependence of QE for a NbN SSPD at 3K and 5K at bias current of 0.94 Ic.
Response of a single 500-µm-long nanowire
Oscillograms of the response for 2-section (a) and 5-section (b) SSPDs
The use of a material with the narrow energy gap and low quasiparticles diffusivity should shift the detectors sensitivity towards longer wavelengths.
Ultrathin (4-10 nm thick) MoRe films were deposited by DC magnetron sputtering of a Mo60/Re40target.
Best MoRe films properties:
Thickness 4 nm 10 nm
Critical temperature Tc=7.7 K 9.7K
Transition width Δ Tc=0.1K 0.2K
Critical current density at 4.2K jc=1.1x106 A/cm2
Sheet resistance Rs=65-75 /□
Oscillogram of the single-photon response of
a 200-nm-wide MoRe nanowire
Dependence of a counting rate on a bias current
G. Gol'tsman at al., Appl. Phys. Lett. 79 (2001), 705.
 A. Semenov at al., Physica C, 352 (2001), 349.
 G. Gol’tsman et al.,IEEE Trans. on Appl. Supercond. 13(2) (2003), 192.
 A. Korneev et al., Appl. Phys. Lett. 84 (2004), 5338.
 A. Korneev et al., SPIE Europe Int. Congress on Optics and Optoelectronics, Prague, Czech Republic, 16 - 19 April 2007.