1 / 3

Wire Loop Height Measurement: Elevating Precision in Manufacturing

Wire loop height measurement is a non-contact dimensional metrology technique for determining the height or thickness of an item or substance. It is most commonly used in the manufacturing industry to measure the height of wire loops or bond pads on semiconductor wafers.

View3
Download Presentation

Wire Loop Height Measurement: Elevating Precision in Manufacturing

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript


  1. Wire Loop Height Measurement: Elevating Precision in Manufacturing Optical metrology is the use of light to define measuring standards. It is more broadly defined as the science of light measurement. According to this broader definition, it may also include measures that focus on the properties of light or those that use light to determine the properties of other things (such as their temperatures, sizes, or distances). Wire loop height measurement is a non-contact dimensional metrology technique for determining the height or thickness of an item or substance. It is most commonly used in the manufacturing industry to measure the height of wire loops or bond pads on semiconductor wafers. What is wire loop height measurements? The innovation provides a system and an instrument for measuring the height of wire loops. The wire loop measuring point is positioned above a height gauge instrument. As electronic equipment becomes smaller, the density of wires required to connect an integrated circuit (IC) chip to a lead frame or packaging board increases. Multiple chips packed in a package are now linked using a technique known as wire bonding.

  2. Controlling the height and form of wire loops generated during wire bonding is critical to ensuring that IC chips fit into packaging as thin as a few millimetres thick. Why it is important? The Wire Loop Height Measurement System is a specialised metrology device used to measure the height of wires in printed circuit boards (PCBs). This is an important parameter since the height of the wires might impact the circuit's performance. To ensure that the PCBs satisfy the specified requirements, the system employs optical coordinate measuring technology. The View provides a variety of metrology systems, including optical coordinate measuring systems and PCB metrology systems, in addition to the wire loop height measurement system. These systems employ modern optical technology to offer exact measurements of numerous components and characteristics, assisting in the production of high-quality goods. Wire loop height measurement apparatus and Method A method and apparatus for determining the height of a point on a wire loop are provided by the invention. A height gauge gadget is placed over the measurement point on the wire loop. The height gauge gadget emits incident light to illuminate the location. The height gauge device receives reflected light produced by incoming light, and a processor connected to the height gauge device estimates the height of the said point relative to a reference surface based on a characteristic of the reflected light. Let's take a quick look at Optical metrology - Viewmm. The study and technique of measuring things and their attributes using light is known as optical metrology. It is a branch of metrology that makes precise measurements of physical quantities such as length, thickness, surface roughness, flatness, and angles using optical equipment and procedures. • Interferometers: These are devices that employ the interference of light waves to measure very tiny distances, angles, and surface features of objects. They are commonly utilised in precise engineering and manufacturing. • Optical microscopes: These devices are used to magnify and visualise things that are too tiny to view with the naked eye. They are used to investigate the microstructure

  3. and morphology of materials and biological samples in materials science, biology, and medical research. • Spectrophotometers: These devices measure light intensity as a function of wavelength. They are used to investigate the chemical composition of materials as well as their optical characteristics like as colour, transparency, and refractive index. • Laser trackers: These are devices that track the movement and location of things using laser beams. They are commonly used for measuring massive components and structures in the aerospace, automotive, and construction sectors. • 3D scanners: These devices employ light to capture the shape and geometry of three- dimensional objects. They are employed in reverse engineering, product design, and quality assurance. The wrapping words View measurement machines will continue to improve the speed, accuracy, and resolution of optically based systems utilised in factory automation metrology applications. View Measurement Machines offers our clients systems that increase product quality, minimise production mistakes, and lower manufacturing costs by utilising high-quality, customised solutions. ViewMM will continue to pioneer and enhance optically-based systems utilised in industrial automation metrology applications in terms of speed, accuracy, and resolution. ViewMM provides our customers with systems that increase product quality, minimise production mistakes, and decrease manufacturing costs with high- quality, personalised solutions. Quality Vision International, Inc. 850 Hudson Avenue Rochester, NY 14621 USA Contact: info@viewmm.com

More Related